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We offer measurement services on: |
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Surface morphology (roughness) and microstructure anlaysis (steps, holes etc.) of samples |
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Chemical surface and bulk analysis (trace) by: |
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Secondary ion mass spectrometry (SIMS) |
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Laser micro mass- and plasma-analysis |
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Raman microscopy |
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UV-Vis-NIR spectroscopy (transmission and diffuse reflection) |
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Material/surface processing in the micrometer range by: |
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Reactive ion etching (RIE) and plasma (or VUV=172 nm) surface treatment |
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Laser microstructuring with laser wavlengths ranging from the UV to mid-IR |
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